砷化镓纳米线的高分辨率扫描电镜和CL图。

通过不同n型掺杂结构的GaAs光谱可以精确地测定纳米线的掺杂水平。

(Nanoletters, 17 (11), pp. 6667-6675 (2017))

Allalin-Chronos-SEM-GaAs-Nanostructure-Characterization-Doping-Metrology-Materials-Characterization-Attolight-Cathodoluminescence
Allalin-Chronos-GaAs-Nanostructure-Characterization-Doping-Metrology-Materials-Characterization-Attolight-Cathodoluminescence
Allalin-Chronos-Spectra-GaAs-Nanostructure-Characterization-Doping-Metrology-Materials-Characterization-Attolight-Cathodoluminescence